Conference Contributions 2005
A. Chuvilin and U. Kaiser
"Multislice simulation of convergent beam electron diffraction"
PSI Proceedings 05-01 (2005) 14
Poster presentation at the Dreil盲ndertagung Davos (Microscopy Conference 2005)
electronic version 250kb pdf-file
T. Kups, A. Chuvilin and U. Kaiser
"TEM investigations of lattice site occupancy of phosphorous doped 4H-SiC"
PSI Proceedings (Microscopy Conference 2005) 05-01 (2005) 78
Oral presentation at the Dreil盲ndertagung Davos (Microscopy Conference 2005)
C. Zaubitzer, S. 骋谤枚锄颈苍驳别谤, A. Chuvilin, U. Kaiser, R. Enchelmaier, A. Ladenburger, K. Thonke, R. Sauer
"TEM Characterizations of Etched Si Nanopillars Prepared by Small Angle Cleavage Technique"
PSI Proceedings 05-01 (2005) 103
Poster presentation at the Dreil盲ndertagung Davos (Microscopy Conference 2005)
electronic version 250kb pdf-file
O. Abrosimov, A. Chuvilin, U. Kaiser
"HACDF Electron Tomography: A First Example"
PSI Proceedings 05-01 (2005) 242
Poster presentation at the Dreil盲ndertagung Davos (Microscopy Conference 2005)
Winner of Best Poster Award
electronic version 1350kb pdf-file
J. Biskupek, U Kaiser, H. Lichte, A. Lenk, M. Kawasaki, N. Sobolev, O. Picht, E. Wendler, W. Wesch
"Magnetic Nanocrystals in Semiconductors"
PSI Proceedings 05-01 (2005) 246
Oral presentation at the Dreil盲ndertagung Davos (Microscopy Conference 2005)
U. Kaiser, A. Chuvilin, and C. K眉bel
"Z-Contrast Tomograpy of Embedded Nanocrystals"
PSI Proceedings 05-01 (2005) 325
Poster presentation at the Dreil盲ndertagung Davos (Microscopy Conference 2005)
electronic version 1350kb pdf-file
U. Kaiser
"Analytical electron microscopy for solid state physics and nanotechnology"
Conference Optics and Photonics
Advanced Metrology - Advanced Characterisation Techniques for Optics, Semiconductors and Nanotechnologies
San Diego, USA, August 2.-6 2005, invited talk
U. Kaiser, A. Chuvilin, and C. K眉bel
"Z-Contrast Imaging and Tomography in a Conventional Transmission Electron Microscope"
63rd Annual meeting of the Microscopy Society America (Microscopy and Micoranalysis 2005)
Honolulu, USA July 31-August 4, 2005
Poster presentation
electronic version 280kb pdf-file